Chip Gallery
2022~ @ Soongsil University
Asynchronous SAR ADC
Process: Samsung 28 nm LP CMOS
Measurement in progress...
Power-on-Reset Generator
Process: Samsung 28 nm LP CMOS
Measurement in progress...
Analog Low-Dropout Regulator
Process: Samsung 28 nm LP CMOS
Measurement in progress...
~2021 @ Seoul National University, Harvard University
Digital Low-Dropout Regulator
Process: TSMC 40 nm CMOS
Publication: 2022 IEEE Asian Solid-State Circuits Conference (A-SSCC)
2023 IEEE Transactions on Power Electronics (TPE)
Electrochemical CMOS ASIC#1
Process: TSMC 180 nm CMOS
Electrochemical CMOS ASIC#2
Process: TSMC 180 nm CMOS
Hybrid Low-Dropout Regulator
Process: TSMC 65 nm CMOS
Publication: 2022 IEEE Journal of Solid-State Circuits (JSSC)
Digital Low-Dropout Regulator
Process: Samsung 28 nm CMOS
Publication: 2020 IEEE International Solid-State Circuits Conference (ISSCC)
2022 IEEE Journal of Solid-State Circuits (JSSC)
Touch Controller AFE
Process: UMC 80 nm HV CMOS
Publication: 2019 IEEE European Solid-State Circuits Conference (ESSCIRC)
Journal version in preparation...
Synthesizable SAR ADC
Process: Samsung 28 nm CMOS
Publication: 2019 IEEE Access
Touch Controller AFE
Process: TSMC 180 nm RF CMOS
Publication: 2019 IEEE Journal of Solid-State Circuits (JSSC)
2019 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED)
Noise-Shaping SAR ADC
Process: Samsung 28 nm CMOS
Publication: 2018 IEEE Asian Solid-State Circuits Conference (A-SSCC)
2022 IEEE Transactions on Very Large Scale Integration (TVLSI)
Asynchronous SAR ADC
Process: TSMC 180 nm RF CMOS
Publication: 2017 대한전자공학회 학술대회
2018 IEEE Transactions on Circuits and Systems II: Express Brief (TCAS-2)
2018 IET Electronics Letters
Touch Controller AFE
Process: TSMC 180 nm RF CMOS
Publication: 2018 IEEE Custom Integrated Circuits Conference (CICC)
Delta-Sigma Modulator
Process: Samsung 65 nm LP CMOS
Publication: 2017 IEEE Transactions on Circuits and Systems II: Express Brief (TCAS-2)
Delta-Sigma Modulator
Process: Magna/Hynix 180 nm CMOS
Publication: 2017 IEEE Asian Solid-State Circuits Conference (A-SSCC)
2023 IEEE Transactions on Very Large Scale Integration (TVLSI)
Touch Controller AFE
Process: TSMC 180 nm GP CMOS
Publication: 2016 IEEE International Solid-State Circuits Conference (ISSCC)
2017 International Conference on Electronics, Information, and Communication (ICEIC)
2019 IEEE Journal of Solid-State Circuits (JSSC)
FFT Processor
Process: Samsung 65 nm LP CMOS
Publication: 2015 대한전자공학회 학술대회